EDXRF for a Wide Range of Samples

The JSX-1000S ElementEye from JEOL is an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types- solids, powders, and liquids- with little or no sample preparation. 

The ElementEye complements SEM, EPMA, NMR, and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes.  A Thin Film FP method is optionally available for non-destructive measurement of film thickness on coated samples.

High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit. Features of the ElementEye include an optional 12-position auto sample changer; touch screen operation; pre-recorded recipes for standard solution applications-  RoHS, Metals (Air/Vacuum), Oxides (Air/Vacuum), Organic Materials (Air/Vacuum)-  high-sensitivity SDD and short-path optical system for high throughput analysis; and residual balance and thickness correction for organic samples. 

JEOL, www.jeolusa.com