JEOL USA offers the JEM-1400Plus, a 120kV Transmission Electron Microscope based on the JEM-1400. The new JEM-1400Plus TEM features high resolution/high contrast imaging,  S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3D tomography, and montaging. This TEM is optimized for biological, polymer, and materials research. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images.

JEOL USA, Inc., 978-535-5900, www.jeolusa.com