CRAIC Technologies introduced the 20/30 XL UV-visible-NIR microspectrophotometer, which is designed to non-destructively analyze microscopic features of very large samples when integrated into large scale sample handling machinery.  With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, Raman, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic sample areas in the UV and NIR regions in addition to high resolution color imaging.  Due to its flexible design which gives it the ability to analyze the largest samples, applications are numerous and include mapping color and intensity variations of flat panel displays, film thickness measurements across the entire surface of 300 mm wafers, scanning the surfaces of hard disks for defects to the analysis of entire paintings with high spatial resolution.

CRAIC Technologies, http://www.microspectra.com