20/30 XL™ Microspectrophotometer

The 20/30 XL™ is designed to work with large scale samples, such as 300 mm wafers, to measure thin film thickness as well as the Raman spectra of microscopic sampling areas. The 20/30 XL™ also offers UV microscopy, a full spectroscopy suite as well as either manual or automated operation. Because of the flexible instrument design, the is no upper limit to the sample size which makes this instrument perfect for everything from quality control of the largest flat panel displays to film thickness of 300 mm wafers.

CRAIC Technologies, (877) 882-7242, www.microspectra.com